Xmega128a4u BO Testplan: Unterschied zwischen den Versionen
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* USB ESD protection is testet: BAS70 diode forward voltage, Z-diode breakdown voltage | * USB ESD protection is testet: BAS70 diode forward voltage, Z-diode breakdown voltage | ||
* Reference voltage capacitors are tested. | * Reference voltage capacitors are tested. | ||
= Testboard = | |||
Version vom 11. Oktober 2013, 10:09 Uhr
This is the explanation how to test the Xmega128a4u breakout board in mass production process.
- All pins on the two 20-pin connectors are tested against short circuit or open connection.
- The crystal is testet by starting the crystal oscillator.
- LEDs are optically tested.
- USB connector is testet against short circuit and open connection.
- USB ESD protection is testet: BAS70 diode forward voltage, Z-diode breakdown voltage
- Reference voltage capacitors are tested.